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Atomic Force Microscopes, Scanning Probe Microscopes



Atomic Force Microscopes:

Manufacturers and suppliers of Atomic Force Microscopes, Scanning Probe Microscopes and related equipment.

See also: cross-references to related topics on the left side.

To suggest a link please use our registration form.


  • Ambios Technology, Inc.
    Profilometer, SPM/AFM, Interferometer Surface Measurement (USA) [e]


  • Infinitesima Limited
    True video rate, high speed AFM™ "Use your AFM like an optical microscope" (UK) [e]


  • JPK Instruments AG
    Scanning Probe Technology for Life Science and Soft Matter (D, ...) [e]


  • Lot-Oriel
    Nanotechnology, SPM, AFM (D, ...) [e, d, ...]


  • Micro Photonics
    Source of advanced instrumentation for scientific and industrial research (USA) [e]


  • Molecular Imaging, Corp.
    Agilent Technologies, the leader in test and measurement tools, has recently acquired Molecular Imaging, the premier manufacturer of Atomic Force Microscope (AFM) and Scanning Probe Microscope (SPM) systems (USA) [e]


  • Nanoscience Instruments, Inc.
    Source for a wide variety of AFM systems, probes, accessories, and related nanoscience tools (USA) [e]


  • Nanosurf AG
    Nanosurf provides easy-to-use STMs for education, AFMs for industry and PLL electronics for research (CH) [e]


  • Novascan Technologies, Inc.
    Atomic Force Microscopy and AFM tools (USA) [e]


  • Pacific Nanotechnology, Inc.
    Our atomic force microscope (AFM) products are optimized for research development and process control applications when visualization and measurement of nanometer sized surface structure is critical (USA) [e]


  • PolyInsight
    Atomic-Force Microscopy (AFM) Services (USA) [e]


  • Veeco Instruments Inc.
    Solutions for a nanoscale world (USA, ...) [e]


  • WITec Wissenschaftliche Instrumente und Technologie GmbH
    The design of the Alpha-SNOM features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument (D) [e]


 
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Subject category: Atomic Force Microscopes

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The author- or copyrights of the listed Internet pages are held by the respective authors or site operators, who are also responsible for the content of the presentations.

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To add your commercial site to this index use the advertising order form. To suggest a non-profit site (scientific information) use the add-url-form.


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Corresponding Chemistry Books

 

 

Jaroslaw Drelich (Editor), K. L. Mittal (Editor)

Atomic Force Microscopy in Adhesion Studies

Brill Academic Pub, 2005.


Ernst Meyer, Hans J. Hug, Roland Bennewitz

Scanning Probe Microscopy: The Lab on a Tip

Springer, 2003.


Bharat Bhushan (Editor), Harald Fuchs (Editor)

Applied Scanning Probe Methods III : Characterization (NanoScience and Technology)

Springer, 2006.


© 1996 - 2007 ChemLin, AJ, updated on 21.03.2007


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